“Our office staff are highly impressed with the publications in IERF’s Country Index Series.”

Anthony W. Adey, International Student Recruitment Officer, Memorial University of Newfoundland

“IERF’s staff is extremely helpful, professional, and responsive.”

Annette Ceccotti, Assistant Vice Chancellor for Admission, Brandman University

“The University of Cincinnati loves IERF evaluations. Keep up the great work!”

Jason Chambers, Assistant Director of International Transfer Admissions, University of Cincinnati

“IERF’s evaluation reports are easy to review and accurate and the grading scale that IERF provides helps our international evaluators determine admission eligibility.”

Sabrina Cortell, Director of Admissions, San Diego State University

“IERF provides us with a sense of security and peace of mind in knowing that our applicants’ credentials have been accurately and securely reviewed.”

James Crane, Assistant Dean of Graduate Studies, Brigham Young University

“I found your presentation incredibly helpful and it’s prompted a discussion amongst our leadership team on how we review documents and how we might shift our policies moving forward”

Jeannie D’Agostino, Assistant Director of Recruitment, Drexel University

“Your reports are detailed and always accurate.”

Suguru Fujiwara, International Transfer Credit and Articulation Specialist, University of Idaho

“Thanks so much for the great presentation on fraudulent credentials.”

Andy Ray, International Student Recruitment Manager, University of Tennessee

“Thank you for all you do! You are such a joy to work with and we appreciate your diligence and your concerns!”

Patricia Ware, International Admissions, Brigham Young University

“I just received the Index of Academic Calendars & Dates and I want to thank you and your team for putting together such an informative resource.”

Donald White: Education Abroad Advisor & Program Coordinator, Appalachian State University

“Thank you for your work; not only your books but also your conference presentations and articles available on your website are rich in information that are absolutely essential to credential evaluation. I look forward to learning more from your publications.”

Jean Yoo, Assistant Credentials Assessor, University of Toronto